PIEZOVIEW

XIRE™ is a brand name deriving from the word “WIRE.” Piezolab cable sensor produces electrical signals in response to the change in pressure or mechanical environments around the cable. We are researching and developing continuously to improve the quality, applying new technology, and creating various applications. Piezolab is passionately pursuing and striving to be the world’s best brand and the state-of-the-art Piezo cable.

│ Description│

So easy, High Accuracy

PIEZOLAB is to provide the total piezoelectric solution for the customer in the world. We are now focused on our simple and reliable piezoelectric d- meter (PIEZOVIEW SERIES), which is specialized for thick or thin piezoelectric films on rigid substrate. Increasingly, these films are taking a core role in MEMS devices such as MICRO-OPTICAL MODULATOR, INK-JET HEAD AND FBAR

PIEZOVIEW provide the piezoelectric coefficients of piezoelectric thin or thick films such as PZT, ZnO and AlN etc. The measuring process is extremely simple and the result is very reliable and repeatable. The time to get result is very short, which is around one minute including the specimen loading, cell alignment and measurement.

The Uncomplicated D-Coefficient Measurement

Unlike other technique, no additional process steps are needed for the measurement itself. This measurement needs the only specimenused in every other measurement such as P-E hysterisis, capacitance and electric leakage test etc., the 1~2 mm in diameter electrode sandwiched piezoelectric films. Due to the extremely simple measuring process, PIEZOVIEW will give you the very high throughput on d-coefficient measurement, which is especiallyeffective when many specimens are prepared for evaluation like process optimization project.

│ Feature│

Excellent Resolution And Repeatibiliyt

The simpler measuring process, the more reliable measurement. Because these piezoelectric measurements are very sensitive to the environments of specimen and system, it is very essential to get rid of any erroneous elements. PIEZOVIEW system is designed to deliver a constant pneumatic load on the film surface and to collect the producing small charge with precise amplifier at the same time. Therefore, PIEZOVIEW will always give you reliable and repeatable piezoelectric results and this also makes it possible to Investigate Low-d material such as ZnO(12pC/N), AlN(5pC/N) and other piezoelectric films.

│ Specifications│

High Ststem Flexibility With Versatile Options

PIEZOVIEW system is designed to satisfy the user specific analysis conditions. Main body of the system basically provides a conventional probe station and thisstation can be connected to the versatile options as followings.

• Anti-Vibration Table for Accuracy Improvement.
• DC Power Supply for on-site Poling above 5V. (Below 5V is installed.)
• LCR Meter and other analyzer for Parameter Analyzing with piezoelectric coefficient.
• Thermal Chuck for Temperature Analysis up to 300℃.